MetroAUTOMOTIVE 2025
Last week, Massimo Orazio Spata had the pleasure of attending IEEE Metroautomotive 2025 conference in Parma, where I had the opportunity to present the latest research developed within the joint Lab DMI-STMicroelectronics.
Our work, titled:
“Silicon-Carbide Power Device X-Ray Screening via Attention-Based Deep Network for a Robust Traction-Inverter in Electric Vehicles” was the result of a fruitful collaboration between academia and industry.
Authors:
Francesco Rundo (University of Catania, Italy)
Giulia Castagnolo (STMicroelectronics, Italy)
Carmelo Pino (STMicroelectronics, Italy)
Massimo Orazio Spata (University of Catania)
Angelo Alberto Messina (STMicroelectronics, Italy)
Sebastiano Battiato (University of Catania, Italy)
Moreover 2 papers accepted for IEEE MetroXRAINE 2025 conference:
-Advanced Non-Local Pipeline for Domain-Adapted Intelligent Power Device Defects Analysis for a Robust Traction Inverter in Next Generation Electric Cars, Francesco Rundo, Carmelo Pino, Giulia Castagnolo, Massimo Orazio Spata, Angelo A. Messina, Michele Calabretta, Sebastiano Battiato.
-Advanced Knowledge Distillation Pipeline with Dynamic Weighted-Smoothed Loss for a Robust Deep Network Deployment in Resource-Constrained Embedded Systems, Francesco Rundo, Carmelo Pino, Giulia Castagnolo, Massimo Orazio Spata, Angelo A. Messina, Michele Calabretta, Sebastiano Battiato.
A big thank to our Academic-Industrial Conjunction Team to University of Catania, to STMicroelectronics, to the organizers and to the research community for the engaging discussions and valuable feedback!