MetroXRAINE 2025
From October 22 to 24, Massimo Orazio Spata have attended MetroXRAINE 2025 IEEE Conference in Ancona, where I presented with an oral two research papers during the main session.
The conference provided an excellent opportunity to discuss recent advances in AI, metrology, and embedded systems. During the conference dinner I had the pleasure and honor to meet and exchange ideas in person, with the Director of China National Information Technology.
Presented papers:
Advanced Knowledge Distillation Pipeline with Dynamic Weighted-Smoothed Loss for a Robust Deep Network Deployment in Resource-Constrained Embedded Systems
Authors: Francesco Rundo (University of Catania, Italy); Giulia Castagnolo and Carmelo Pino (STMicroelectronics, Italy); Massimo Orazio Spata (University of Catania, Italy); Angelo Alberto Messina and Michele Calabretta (STMicroelectronics, Italy); Sebastiano Battiato (University of Catania, Italy)
Advanced Non-Local Pipeline for Domain-Adapted Intelligent Power Device Defects Analysis for a Robust Traction Inverter in Next Generation Electric Cars
Authors: Carmelo Pino (STMicroelectronics, Italy); Francesco Rundo (University of Catania, Italy); Giulia Castagnolo (STMicroelectronics, Italy); Massimo Orazio Spata (University of Catania, Italy); Angelo Alberto Messina and Michele Calabretta (STMicroelectronics, Italy); Sebastiano Battiato (University of Catania, Italy)
Thanks to my co-authors and to the MetroXRAINE 2025 organizers for a well-organized and stimulating event.
